X Ray Inspection System

HY-XR8001 supports offline scanning and imaging for product Regions of Interest (ROI). Following 3D reconstruction, our dedicated visualization analysis software delivers accurate analytical measurement. Ideal for in-process quality control, failure analysis and laboratory research, the system performs fully non-destructive testing to visualize internal product structures and hidden defects, with complete measurement and analytical capabilities.

HY-XR5010(2.5D) Series performs non-destructive testing for IC packaging, BGA/QFN chips, PCBA and capacitors. Equipped with CNC motion, multi-angle imaging and one-click void analysis, it detects voids, solder faults and dimensional errors. Three models fit small-batch checks, production sampling and lab R&D; optional barcode tracking and a high-res detector spot defects as tiny as 4μm. Full enclosed lead shielding limits radiation below 1μSv/h, with complete official radiation safety certifications.

HY-XR5010A  (2D) Series detects invisible internal flaws of industrial workpieces. It integrates micro-focus ray source, high-definition flat-panel imaging and CNC automatic inspection functions, equipped with reliable radiation protection design, suitable for offline quality control of medium-volume production lines across multiple manufacturing sectors.