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Tantalum & Aluminum Capacitor Test & Sorting Machine

HY-CS3025 Semiconductor Handler is dedicated to visual defect inspection, electrical performance testing, and finished product packaging of chip tantalum capacitors and multi-layer aluminum capacitors.

  • Brand :

    HYRNUS
  • Item No. :

    HY-CS3025
  • Order(MOQ) :

    1 Set
  • Warranty :

    One-Year Warranty and Lifetime Maintenance
  • Payment :

    T/T
  • Lead Time :

    7-35 Days
  • Product Origin :

    China
  • Tantalum & Aluminum Capacitor Test & Sorting Machine

    Product Introduction

    HY-CS3025 Test & Sorting Machine is compatible with tape and bulk feed, integrating shaping, AI visual inspection, high-precision electrical performance testing, and finished product taping into one single platform.It adopts a standard turret with imported DD motors, delivering positioning accuracy of ±0.01 mm and an UPH of up to 60K. Capacitance testing offers high repeatability and strong insulation performance. The AI vision system supports multi-sided inspection with accuracy ≥50 μm, paired with an Industry 4.0 data system for full end-to-end traceability.

    Key Test & Environmental Capabilities

    Its modular design enables one-click changeover to adapt to consumer electronics, automotive electronics and other fields. With an inspection accuracy rate ≥97%, it helps production lines improve quality and efficiency while reducing operational and defect-related costs.

    sorting machine

    Application Scenarios

    Including but not limited to testing of chip tantalum capacitors and multi-layer aluminum capacitors. Please contact us for special requirements.

    Technical Specifications

    Item Specification
    Model HY-CS3025
    Chip Package Sizes Case A, B, C, D, etc.
    Input Format Bulk
    Output Format Tape & Reel (T&R)
    Equipment UPH ≥ 14K (leakage current charge/discharge time ≤ 48 s)
    Main Test Items Capacitance & Dissipation Factor, ESR, Leakage Current, Residual Voltage
    Front & Back Inspection Inspection accuracy > 50 µm; detectable at contrast > 30Defect types: blurred labels (mixed components), scratches, pinholes, chipping, missing cores, cracks, contamination, lead deformation, lead lifting, over/under-length leads, lead copper exposure, lead overflow, lead burrs, edge indentations, tin whiskers, etc.
    Equipment Dimensions 2100 mm (L) × 1500 mm (W) × 2000 mm (H)

    Product Details

    chip sorter

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If you are interested in our products and want to know more details,please leave a message here,we will reply you as soon as we can.

leave a message

leave a message
If you are interested in our products and want to know more details,please leave a message here,we will reply you as soon as we can.
Contact us:allen@hyrnus.com