Chip Capacitor Test & Sorting Machine for Visual Defect Inspection

HY-CS3021 Test & Sorting Machine specializes in these functions for chip capacitors, including SLC, array capacitors, MLC, silicon capacitors and other types. It meets the high-precision, high-compatibility and intelligent requirements for large-scale production of miniature semiconductor components, and is key equipment to improve the outgoing quality and production efficiency of chip capacitors.

HY-CS3021 Test & Sorting Machine adopts a full modular architecture with freely configurable structure and modular wearing parts, supporting quick changeover and adaptation to multi-specification product switching. Integrating traditional mature algorithms with AI inspection technology and CCD auto-focusing, it achieves recognition accuracy ≥5μm, supports 2-sided / 6-sided appearance inspection, and accurately detects defects such as electrode oxidation, scratches and corner chipping.

Application Scenarios

Single-layer chip capacitors (SLC)

Multi-layer chip capacitors (MLC/MLCC)

Silicon capacitors

RC networks

Array chip capacitors

Technical Specifications

Item	Specification
Model	HY-CS3021
Product Size	0.2mm × 0.2mm ~ 10mm × 10mm
Input Formats	Bulk / Wafer
Output Formats	Waffle Pack / Gel-Pak / Wafer
Equipment UPH	≥ 5K (test time ≤ 200 ms)
Main Test Items	Capacitance, Dissipation Factor, Insulation Resistance, Withstand Voltage
Waffle Pack Placement Accuracy	Single-side spacing ≥ 0.03 mm; placement success rate > 96%
Blue Tape Placement Accuracy	±25 µm; ±1°
Visual Inspection	Inspection accuracy > 5 µm; detectable at contrast > 30Detectable defects: scratches, wear, missing plating, excess plating, curling, peeling, dents, indentations, discoloration, contamination, chipping, electrode position offset, etc.
Equipment Dimensions	1500 mm (L) × 1300 mm (W) × 1900 mm (H)

Product Details