The HY-TM200 Semiconductor Metallurgical Measuring Microscope combines optical observation, digital imaging, and precision measurement. It supports bright-field and dark-field inspection with positioning accuracy up to ±0.1 μm. The system is suitable for measuring gold balls, wire loops, IC packages, PCBs, and other electronic components in quality control and R&D applications.
Brand :
HYRNUSItem No. :
HY-TM200Order(MOQ) :
1 SetWarranty :
One-Year Warranty and Lifetime MaintenancePayment :
T/TLead Time :
7-35 DaysProduct Origin :
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