Product Introduction
HY-PS13 13L RF Vacuum Plasma Cleaner is a capacitively coupled (CCP) vacuum plasma system engineered for wafer & silicon substrate photoresist stripping, surface cleaning and activation. Widely adopted by university research labs, enterprise R&D centers and small-volume semiconductor manufacturing lines, this all-square stainless steel plasma unit integrates a vacuum processing chamber, plasma generator, vacuum pump and complete gas inlet & outlet assemblies.
Featuring military-grade hermetic welding, 3-layer wafer tray and 13.56MHz auto-matching RF power supply, it greatly boosts substrate surface adhesion and optimizes material hydrophilicity. It delivers stable, consistent processing performance for wafer bonding, coating, thin-film deposition, microfluidic packaging and all types of precision material modification workflows.
Product Application
1. Cleaning: Removal of organics, oxides, metal salts, nano-scale particulate contaminants, etc.
2. Activation: Hydrophilic/hydrophobic modification, surface energy improvement, functional group grafting, biocompatibility optimization, etc.
3. Etching: Surface patterning, micro-etching, surface morphology & roughness adjustment, etc.
4. Bonding: Bonding of microfluidic devices such as PDMS chips.
5. Photoresist Stripping: Photoresist ashing, bottom anti-reflective coating (BARC) removal, etc.

Product Features
1. Stainless steel vacuum chamber manufactured with military-grade welding technology, delivering outstanding air tightness and long-term durability for stable plasma processing.
2. 3-layer stainless steel sample tray design supports small-batch processing and greatly maximizes internal chamber space utilization.
3. User-friendly touchscreen HMI allows real-time monitoring and full parameter control of the entire processing cycle.
4. Stores multiple custom process recipes for one-click recall; all historical process data is fully traceable for experiment and production records.
5. Dual high-precision MFC mass flow controllers, enabling flexible testing of mixed gas ratios to optimize cleaning and treatment results.
6. Equipped with a 13.56MHz RF plasma power supply with automatic impedance matching, offering superior process stability and repeatability.
Machine Outline Drawing and Vacuum Chamber Diagram

Technical Specifications
| No. |
Category |
Item |
Specification & Parameters |
| 1 |
Plasma Generator |
Solid-state Power Supply |
Adjustable from 0–300W, standard sine wave output; stability ≤ ±0.5%; protection against overvoltage, overcurrent, overtemperature and reflected power |
| Anti-radiation High-Frequency Matcher |
High-speed automatic matching within 0.1s, supports network communication |
| RF Frequency |
13.56 MHz |
| 2 |
Vacuum Reaction Chamber |
Chamber Material |
Imported 316 stainless steel with military-grade sealing |
| Chamber Volume |
240(W) × 280(D) × 200(H) mm; 13L |
| Effective Processing Space |
205(W) × 210(D) × 30(H) mm |
| Processing Layers |
3 layers |
| Electrode Spacing |
45 mm |
| Tray Spacing |
30 mm |
| Uniformity |
Within-wafer uniformity ≤ ±20%; wafer-to-wafer uniformity ≤ ±20%; batch-to-batch uniformity ≤ ±20% |
| 3 |
Discharge Electrode |
Electrode |
Special high-conductivity aluminum alloy electrode |
| Discharge Mode |
CCP & RIE ion reaction discharge modes |
| 4 |
Gas Circuit Control |
Gas Mass Flow Controller |
300 SCCM |
| Gas Circuit Design |
Uniform chamber gas inlet design to guarantee consistent cleaning & etching effects |
| Gas Channels |
2 gas channels, compatible with O₂, Ar, N₂, H₂, etc. Notify us in advance if corrosive gases are required |
| 5 |
Vacuum Measurement |
Vacuum Measuring System |
Measuring range: 5×10⁻² ~ 1.0×10⁵ Pa |
| Measurement accuracy: 0.1 Pa |
| 6 |
Pumping System |
Vacuum Pump |
16 m³/h |
| Vacuum Pipeline |
Stainless steel pipeline + pneumatic valves |
| 7 |
Control System |
Control Mode |
PLC |
| Touchscreen |
7-inch touch panel |
| Real-time Monitoring |
Real-time display of power, vacuum degree, air pressure, gas flow, working time, etc. |
| Software Program |
Self-developed patented plasma control system; 3-level authority management; auto & manual modes; recipe parameter setting, storage & recall; alarm history query, IO monitoring |
| Alarm Functions |
Vacuum protection alarm, glow loss alarm, power overload alarm, air pressure alarm, phase sequence alarm |
| 8 |
Site Conditions |
Pressure Balancing Function |
Supports process gas inlet with configurable balancing time for pressure stabilization |
| Power Supply |
220V, 50/60Hz, 9A |
| Gas Pipe Connector |
6 mm diameter |
| Gas Purity Requirement |
99.99% |
| Gas Inlet Pressure |
0.4–0.6 MPa |
| Exhaust Port |
KF25 flange |
| 9 |
Overall Unit Parameters |
Total Power Consumption |
2 KW |
| Overall Dimension |
640mm (W) × 665mm (D) × 580 mm (H) |
Operating Environment (Items to be Prepared by Customer)
| No. |
Item |
Requirements |
| 1 |
Power Supply |
Grid standard: 220V, 50/60Hz, voltage fluctuation ±10%; the ground wire meets international standards; no strong electromagnetic interference around the equipment installation position. |
| 2 |
Installation Environment |
Ambient temperature: 0–40°C; Relative humidity: 15%–60%. |
| 3 |
Gas Source |
Gas cylinders for O₂, Ar, N₂, H₂ and other process gases (equipped with pressure reducing valves); inlet gas pressure >0.3MPa; gas pipe connector diameter: Φ6mm. |
| 4 |
Exhaust Pipeline |
Connect to the exhaust outlet of the vacuum pump (mandatory for cleanroom applications). |